Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-10-02
2007-10-02
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
10710914
ABSTRACT:
A method, system and program product are disclosed that create new shapes at detected shape overlaps and includes those new shapes during routing and net checking when the new shapes require a larger space than any of the overlapping shapes. The invention thus detects and prevents spacing errors without the expense of time consuming design rule checking (DRC), facilitating early detection and prevention of errors.
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Darden Laura R.
Lasher Mark R.
Do Thuan
Hoffman Warnick & D'Alessandro LLC
Levin Naum
LandOfFree
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