Out-of-plane birefringence measurement

Details Out-of-plane birefringence measurement Out-of-plane birefringence measurement

2007-12-25

2007-12-25

Punnoose, Roy M. (Department: 2886)

Optics: measuring and testing

By polarized light examination

With birefringent element

Reexamination Certificate

active

11155825

ABSTRACT:
The disclosure is directed to precise measurement of out-of-plane birefringence properties of samples of transparent optical material. Two angled-apart light beams are passed through a selected location of a sample optical element. One of the beams is incident to the sample surface. The characteristics of the beams are detected after passing through the sample, and the information detected is processed to determine the out-of-plane birefringence.

REFERENCES:
patent: 5956146 (1999-09-01), Nakagawa

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