Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2007-04-17
2007-04-17
Hoff, Marc (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S189000, C702S194000, C702S197000
Reexamination Certificate
active
11097568
ABSTRACT:
An enhancement filter for an oscilloscope is disclosed wherein the enhancement filter may be initially calibrated for one or more channels and/or for one or more attenuation settings such as 50 mV per division, 100 mV per division, and/or 200 mV per division, for example. In one embodiment, a desired filter response is selected to have a modified Gaussian type filter function having an at least approximately linear phase response, wherein the transfer function of the desired filter response comprises a step response that is be stored in the oscilloscope to be used as a part of calibration system of the oscilloscope.
REFERENCES:
patent: 5978742 (1999-11-01), Pickerd
patent: 6111400 (2000-08-01), Foster et al.
patent: 6234658 (2001-05-01), Houldsworth
patent: 6459256 (2002-10-01), Pickerd
patent: 6473701 (2002-10-01), Tallman et al.
patent: 6542914 (2003-04-01), Pupalaikis
White Paper: “DSP in High Performance Oscilloscopes”, John J. Pickerd, Tektronix, Inc., Copyright 2004.
White Paper: “Advantages and Disadvantages of Using DSP Filtering on Oscilloscope Waveforms”, Agilent Technologies, Inc., Copyright 2004.
Pickerd John J.
Tan Kan
Cool Kenneth J.
Hoff Marc
Lenihan Thomas F.
Suarez Felix
Tektronix Inc.
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