Organometallic precursors for the chemical phase deposition...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S681000, C438S475000, C257SE21008, C257S017000, C257S319000

Reexamination Certificate

active

11096860

ABSTRACT:
Chemical phase deposition processes utilizing organometallic precursors to form thin films are herein described. The organometallic precursors may include a single metal center or multiple metal centers. The chemical phase deposition may be chemical vapor deposition (CVD), atomic layer deposition (ALD), or hybrid CVD and ALD. The use of these chemical phase deposition processes with the organometallic precursors allows for the conformal deposition of films within openings having widths of less than 100 nm and more particularly less than 50 nm to form thin films such as barrier layers, seed layers, and adhesion layers.

REFERENCES:
patent: 5998870 (1999-12-01), Lee et al.
patent: 6139700 (2000-10-01), Kang et al.
patent: 6482262 (2002-11-01), Elers et al.
patent: 6498091 (2002-12-01), Chen et al.
patent: 6767582 (2004-07-01), Elers
patent: 7049226 (2006-05-01), Chung et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Organometallic precursors for the chemical phase deposition... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Organometallic precursors for the chemical phase deposition..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Organometallic precursors for the chemical phase deposition... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3751694

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.