Organic silica-based film, method of forming the same,...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Reexamination Certificate

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C438S790000, C257SE21261

Reexamination Certificate

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11176622

ABSTRACT:
A method of forming an organic silica-based film, including: applying a composition for forming an insulating film for a semiconductor device, which is cured by using heat and ultraviolet radiation, to a substrate to form a coating; heating the coating; and applying heat and ultraviolet radiation to the coating to effect a curing treatment, wherein the composition includes organic silica sol having a carbon content of 11.8 to 16.7 mol %, and an organic solvent, the organic silica sol being a hydrolysis-condensation product produced by hydrolysis and condensation of a silane compound selected from compounds shown by the general formulae (1): R1Si(OR2)3, (2): Si(OR3)4, (3): (R4)2Si(OR5)2, and (4): R6b(R7O)3-bSi—(R10)d—Si(OR8)3-cR9c.

REFERENCES:
patent: 6204201 (2001-03-01), Ross
patent: 6235101 (2001-05-01), Kurosawa et al.
patent: 6383913 (2002-05-01), Tsai et al.
patent: 6413647 (2002-07-01), Hayashi et al.
patent: 6495264 (2002-12-01), Hayashi et al.
patent: 6809041 (2004-10-01), Interrante et al.
patent: 6902771 (2005-06-01), Shiota et al.
patent: 7026053 (2006-04-01), Shiota et al.
patent: 7060909 (2006-06-01), Fukuyama
patent: 7128976 (2006-10-01), Hayashi et al.
patent: 2003/0104225 (2003-06-01), Shiota et al.
patent: 2003/0157340 (2003-08-01), Shiota et al.
patent: 2004/0058090 (2004-03-01), Waldfried et al.
patent: 2005/0096415 (2005-05-01), Akiyama et al.
patent: 2005/0136687 (2005-06-01), Lu et al.
patent: 2006/0006541 (2006-01-01), Tsuchiya et al.
patent: 1 122 770 (2001-08-01), None
patent: 1122770 (2001-08-01), None
patent: 63-248710 (1988-10-01), None
patent: 63-289939 (1988-11-01), None
patent: 1-194980 (1989-08-01), None
patent: 3-30427 (1991-02-01), None
patent: 8-29932 (1996-03-01), None
patent: 2000-109695 (2000-04-01), None
patent: 2000-290590 (2000-10-01), None
patent: 2000-313612 (2000-11-01), None
patent: 2001-110802 (2001-04-01), None
patent: 2002-288268 (2002-10-01), None
patent: 2003-031566 (2003-01-01), None
patent: 2004-59737 (2004-02-01), None
patent: 2004-149714 (2004-05-01), None
patent: 548236 (2003-08-01), None
patent: WO 03/025994 (2003-03-01), None
H. Miyajima, et al., “The Application of Simultaneous eBeam Cure Method for 65 nm node Cu/Low-k Techonology with Hybrd (PAE/MSX) Structure”, pp. 222-224, 2004.
Ed Mickler, et al., “A Charge Damage Study Using an Electron Beam Low k Treatment”, pp. 190-192, 2004.
“Starfire® SP-DEPCS”, Starfire® Systems, www.starfiresystems.com, May 2005, p. 1.
“Starfire® SP-DMPCS”, Starfire® Systems, www.starfiresystems.com, May 2005, p. 1.
“Specialty Chemicals”, Starfire Systems, (1), p. 1.
“Specialty Chemicals”, Starfire Systems, (2), p. 1.
“Internet Archive WayBack Machine”, http://web.archive.org/web/*/http://www.starfiresystems.com, p. 1.
“Starfire Systems: Projects, Specialty Chemicals”, http://web.archive.org/web/20011205120755/www.starfiresystems.com/projects/chemicals.html, p. 1-2.
James L. Hedrick, et al., “Templating Nanoporosity in Thin-Film Dielectric Insulators”, Advanced Materials, vol. 10, No. 13, 1998, pp. 1049-1053.
U.S. Appl. No. 11/176,622, filed Jul. 8, 2005, Tsuchiya et al.
U.S. Appl. No. 11/184,964, filed Jul. 20, 2005, Tsuchiya et al.
U.S. Appl. No. 11/596,295, filed Nov. 13, 2006, Akiyama et al.
U.S. Appl. No. 11/596,188, filed Nov. 13, 2006, Akiyama et al.
U.S. Appl. No. 11/484,604, filed Jul. 12, 2006, Nakagawa et al.
U.S. Appl. No. 11/485,508, filed Jul. 13, 2006, Nakagawa et al.
U.S. Appl. No. 11/486,085, filed Jul. 14, 2006, Nakagawa et al.
U.S. Appl. No. 11/489,468, filed Jul. 20, 2006, Akiyama et al.
U.S. Appl. No. 11/580,959, filed Oct. 16, 2006, Akiyama et al.

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