Optimized testing of bit fields

Details Optimized testing of bit fields Optimized testing of bit fields

2006-08-01

2006-08-01

DeCady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital data error correction

C714S763000, C714S003000

Reexamination Certificate

active

07085989

ABSTRACT:
A method for comparing bit field contents for bit fields comprising less than a full complement of the source is provided. The method includes creating a mask covering the bit field in the source, setting bit positions within the mask that are outside the bit field in the source to predetermined values, combining the source against the mask to form an intermediate result, and comparing bits in the intermediate result to provide a final result. Alternately, the method may form a mask, combining the bit field with a comparison value to form an intermediate value, and perform a combined function using the mask to select bits from the intermediate value, or fixed zero or one values, and comparing this result with zero.

REFERENCES:
patent: 5268995 (1993-12-01), Diefendorff et al.
patent: 6300770 (2001-10-01), Watkins et al.
patent: 6594317 (2003-07-01), Gorday et al.
patent: 6658002 (2003-12-01), Ross et al.
patent: 6760837 (2004-07-01), Laurenti et al.
patent: 2004/0153913 (2004-08-01), Fishman et al.

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