Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate
2006-08-08
2006-08-08
Ghyka, Alexander (Department: 2812)
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
C219S497000, C219S483000
Reexamination Certificate
active
07087443
ABSTRACT:
A system for minimizing thermal reactor temperature overshoot and stabilization during a boat push. In one embodiment, the setpoint temperatures are reduced to a minimum value. As the temperature in the thermal reactor begins to increase, the setpoint temperatures are ramped back to the original setpoint temperature.
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1) Numerical Heat Transfer Simulations of A Vertical Batch Furnance Under Closed-Loop Temperature Control; Semitool, Inc.; Apr. 5, 1997; pp. 110-117.
2) Improving Furnaces With Model-Based Temperature Control; Solid State Technology; Nov. 1996; pp. 119, 120, 122, 126, 128 and 131.
Hornberg Christopher R.
Stoddard Kevin D.
Brooks Automation Inc.
Ghyka Alexander
Perman & Green, LLP.
Pickreign Richard
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