Optimized pin assignment with constraints

Details Optimized pin assignment with constraints Optimized pin assignment with constraints

2005-03-29

2005-03-29

Tokar, Michael (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S765010

Reexamination Certificate

active

06873147

ABSTRACT:
A novel method for finding optimized solutions for assigning pins to probes in a constrained tester environment is presented. Given a test system network, including the nodes, probes, pins, resources, probe-to-resource mappings, resource-to-pin mappings, and test-to-resource mappings, and constraints including a Multiple-Resource-Per-Probe Constraint, a Same-Module Constraint, and/or a Multiplexing Constraint, the test system network is modeled as a Network Flow Problem to handle all of the constraints of the constrained pin-to-probe assignment problem, using “dummy” probes where necessary to model the constrained network. A modified Maximum Flow Algorithm that satisfies the network constraints is applied to the Network Flow Problem to generate a solution to said constrained pin-to-probe assignment problem.

REFERENCES:
patent: 6477682 (2002-11-01), Cypher
patent: 6744262 (2004-06-01), Adamian

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