Electrical computers and digital data processing systems: input/ – Input/output data processing – Direct memory accessing
Reexamination Certificate
2005-06-15
2008-12-30
Hafiz, Tariq R. (Department: 2182)
Electrical computers and digital data processing systems: input/
Input/output data processing
Direct memory accessing
C714S048000, C714S052000, C714S815000
Reexamination Certificate
active
07472207
ABSTRACT:
Programmatic detection of time-gap defects in computer system hardware where data is corrupted without detection by the computer system. A detection module initiates data transfers between devices in a computer system. An interrupt service routine interrupts the process by inserting a delay into the data transfer. The detection module then checks for time-gap defects by determining if data was corrupted which went undetected by the computer system. The detection module may repeat the data transfer and insert successively longer delays until a time-gap defect is detected or until a maximum delay value is reached. The results of any time-gap defects found may be output to a user. The length of the delays inserted into a data transfer may be determined dynamically using an iterative search technique to more rapidly converge on time-gap defects. Both bisection and Fibonacci search methods are examples that may be used.
REFERENCES:
patent: 3908099 (1975-09-01), Borbas et al.
patent: 4053926 (1977-10-01), Lemoine et al.
patent: 4459661 (1984-07-01), Kaneda et al.
patent: 4589063 (1986-05-01), Shah et al.
patent: 4654783 (1987-03-01), Veres et al.
patent: 4727480 (1988-02-01), Albright et al.
patent: 4745604 (1988-05-01), Patel et al.
patent: 4779187 (1988-10-01), Letwin
patent: 4888680 (1989-12-01), Sander et al.
patent: 4942606 (1990-07-01), Kaiser et al.
patent: 4996690 (1991-02-01), George et al.
patent: 5093910 (1992-03-01), Tulpule et al.
patent: 5212795 (1993-05-01), Hendry
patent: 5233692 (1993-08-01), Gajjar et al.
patent: 5237567 (1993-08-01), Nay et al.
patent: 5379414 (1995-01-01), Adams
patent: 5416782 (1995-05-01), Wells et al.
patent: 5422892 (1995-06-01), Hii et al.
patent: 5471488 (1995-11-01), Bender
patent: 5528755 (1996-06-01), Beardsley et al.
patent: 5619642 (1997-04-01), Nielson et al.
patent: 5870541 (1999-02-01), Tamura
patent: 6088775 (2000-07-01), Inoue et al.
patent: 6115416 (2000-09-01), Katsman et al.
patent: 6223301 (2001-04-01), Saneler et al.
patent: 6502210 (2002-12-01), Edwards
patent: 2002/0101912 (2002-08-01), Phelts et al.
patent: 2003/0021364 (2003-01-01), Fan et al.
NEC Electronics, Inc., “IBM-NEC Meeting for μPD765A/μPD72065 Problem” (U.S.A., May 1987).
Intel Corporation, Letter to customers from Jim Sleezer, Product Manager, with attachments, regarding FDC error and possible solutions (U.S.A., May 2, 1988).
Adams, P.M., Nova University, Department of Computer Science, “Hardware-Induced Data Virus,” Technical Report TR-881101-1 (U.S.A., Nov. 14, 1988).
Advanced Military Computing, “Hardware Virus Threatens Databases,” vol. 4, No. 25, pp. 1 & 8 (U.S.A. Dec. 5, 1988).
Intel Corporation, “8237A/8237A-4/8237A-5 High Performance Programmable DMA Controller” (U.S.A., date unknown) pp. 2-52 to2-67.
Intel Corporation, “8272A Single/Double Density Floppy Disk Controller” (U.S.A., date unknown) pp. 6-478 to 6-491.
AFTG-TG, L.L.C.
Hafiz Tariq R.
Pate & Pierce & Baird
LandOfFree
Optimized-incrementing, time-gap defect detection apparatus... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optimized-incrementing, time-gap defect detection apparatus..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optimized-incrementing, time-gap defect detection apparatus... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4043146