Optical trigger for PICA technique

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

active

11098850

ABSTRACT:
Optical triggering system and method for synchronizing a test of an integrated circuit chip with its operation. An optical triggering system includes a testing mechanism, such as a PICA testing mechanism, for testing an integrated circuit chip. An optical trigger mechanism generates an optical trigger signal for synchronizing a test of the integrated circuit chip with its operation. The optical trigger mechanism provides an optical trigger signal having reduced jitter and a higher frequency rate than an electrical trigger signal resulting in a more accurate test of the integrated circuit chip.

REFERENCES:
patent: 5327782 (1994-07-01), Sato et al.
patent: 6459844 (2002-10-01), Pan
patent: 6859031 (2005-02-01), Pakdaman et al.
patent: 6952107 (2005-10-01), Rahmatian

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