Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-07-03
2007-07-03
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
11098850
ABSTRACT:
Optical triggering system and method for synchronizing a test of an integrated circuit chip with its operation. An optical triggering system includes a testing mechanism, such as a PICA testing mechanism, for testing an integrated circuit chip. An optical trigger mechanism generates an optical trigger signal for synchronizing a test of the integrated circuit chip with its operation. The optical trigger mechanism provides an optical trigger signal having reduced jitter and a higher frequency rate than an electrical trigger signal resulting in a more accurate test of the integrated circuit chip.
REFERENCES:
patent: 5327782 (1994-07-01), Sato et al.
patent: 6459844 (2002-10-01), Pan
patent: 6859031 (2005-02-01), Pakdaman et al.
patent: 6952107 (2005-10-01), Rahmatian
Song Peilin
Stellari Franco
Dougherty Anne V.
Glanzman Gerald H.
Nguyen Ha Tran
Nguyen Trung Q.
Yee Duke W.
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