Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent
1995-03-20
1998-12-01
Font, Frank G.
Optics: measuring and testing
By polarized light examination
Of surface reflection
356356, 356355, 356 731, 356237, G01J 400
Patent
active
058446826
ABSTRACT:
Whether or not an object is present, the surface state of the object, the material constituting the object and the presence of scattering bodies are discriminated through a simple arrangement which includes a light-emitting element for projecting light upon an object to be sensed, and a polarization beam splitter upon which light reflected from the object (or light transmitted through or scattered from the object) impinges. Reflected light from the polarization beam splitter is received by a first light-receiving element, and transmitted light from the polarization beam splitter is received by a second light-receiving element. The aforesaid discrimination is performed on the basis of the value of S/P, S-P, S-kP or (S-P)/(S+P), where S and P represent light-reception signals from the first and second light-receiving elements, and k is a constant.
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"Thin-Film Optical Filters," H.A. Macleod (Japanese translation).
"Optical Thin Films", S. Fujiwara.
Ekawa Kouichi
Hosokawa Hayami
Kiyomoto Hironobu
Yasuda Naru
Font Frank G.
Omron Corporation
Ratliff Reginald A.
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