Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-02-21
2009-12-08
Whitmore, Stacy A (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C430S005000, C430S030000, C382S144000, C382S145000
Reexamination Certificate
active
07631288
ABSTRACT:
A method of performing optical proximity effect correction includes defining a partial area of an entire area of a mask pattern, the mask pattern including a real pattern and a dummy pattern, and performing optical proximity effect correction only with respect to the partial area.
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Minemura Masahiko
Sakurai Mitsuo
Fujitsu Microelectronics Limited
Fujitsu Patent Center
Whitmore Stacy A
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