Optical position measuring device

Details Optical position measuring device Optical position measuring device

2005-11-08

2005-11-08

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

Position or displacement

Position transverse to viewing axis

C356S614000, C250S559290, C250S23700G, C250S201500

Reexamination Certificate

active

06963409

ABSTRACT:
An optical position measuring system including a periodic grating structure and a scanning unit. The scanning unit includes a light source that directs light towards the periodic grating structure and an optical lens device that receives light from the periodic grating structure and creates an image of the periodic grating structure in an image plane, the optical lens device having a periodic lens array with a grating period, AG(r) or the mutual distance between adjoining lenses of said lens array defined by the equation:AG⁡(r)=β⁡(r)*[t⁡(r)*[k+i+n]+ψ](β⁡(r)+1)whereinAG(r) is the grating pert(r) the period of the periodic grating structure,|β(r)| the absolute amount of the image magnification factor β of the lens arrayΨ a presettable defined phase shiftr the radius of the grating arrangement, wherein inthe case of a linear grating r=∞ and AG,tand |β| are constants,i, k, n ε N, i.e. are natural numbers, including zero.

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