Image analysis – Histogram processing – For setting a threshold
Patent
1990-11-20
1993-08-24
Razavi, Michael T.
Image analysis
Histogram processing
For setting a threshold
382 43, 359561, G06K 976
Patent
active
052395952
ABSTRACT:
A method of obtaining a correlation between a pattern to be identified and a number of reference patterns by irradiating and displaying the pattern to be identified and the reference patterns on an optical display plane, thereby producing a complex optical amplitude distribution. This distribution is Fourier-transformed to produce a first power spectrum corresponding to the light intensity distribution of its Fourier transformation patterns. The patterns are again irradiated based upon the first power spectrum and a second Fourier transform is performed to produce a second power spectrum which is the light intensity distribution of the second Fourier transformation pattern. The area of this distribution is restricted by controlling the transmittance or the reflectance of each of the portions of the display plane.
REFERENCES:
patent: 4573198 (1986-02-01), Anderson
patent: 5029220 (1991-07-01), Juday
A Real-Time Programmable Joint Transform Correlator; pp. 10-16, "Optics Communications"; Nov. 1, 1984; vol. 52, No. 1.
A Technique for Optically Convolving Two Functions; C. S. Weaver et al.; "Applied Optics"; pp. 1248-1249; vol. 5, No. 7; Jul. 1966.
Detection of Differences in Real Distributions; pp. 1490-1494; "Journal of the Optical Society of America"; James E. Rau; Nov., 1966.
Synthetic Discriminant Function-Based Binary Nonlinear Optical Correlator; "Applied Optics"; Bahram Javidi; vol. 28, No. 13; Jul. 1, 1989.
Joint Transform Correlator Limitations; "SPIE"; Don A. Gregory et al.; pp. 198-207; vol. 1053; 1989.
Illumination Dependence of the Joint Transform Correlation; "Applied Optics"; vol. 28, pp. 3288-3290; Aug. 15, 1989.
Takemura Yasuhiro
Takesue Toshiharu
Jung Yon
Razavi Michael T.
Sumitomo Cement Company Ltd.
LandOfFree
Optical method for identifying or recognizing a pattern to be id does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optical method for identifying or recognizing a pattern to be id, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical method for identifying or recognizing a pattern to be id will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-835194