Toshiharu Takesue

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Apparatus for identifying an object utilizing a tracking means a

Optics: measuring and testing – For size of particles – By particle light scattering
Patent

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Condition-analyzing device

Communications: electrical – Condition responsive indicating system – Specific condition
Reexamination Certificate

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Method and apparatus for optical pattern recognition

Image analysis – Image transformation or preprocessing – Correlation
Patent

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Method of optical recognition and classification of patterns

Image analysis – Pattern recognition – Classification
Patent

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Monitoring apparatus

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
Reexamination Certificate

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Profile ID: LFUS-PAI-P-256259

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