Optical image measuring apparatus

Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type

Reexamination Certificate

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Details

C351S200000, C351S205000

Reexamination Certificate

active

07614744

ABSTRACT:
An optical image measuring apparatus capable of speedily starting image measurement in response to a measurement start request and performing image measurement on a region on which focus is achieved at determination of an image region. When observation light (M) is focused on an observation CCD camera (23), measurement CCD cameras (21, 22) are disposed to have a measurement object point (Q) in a position shifted from point (P) to an apparatus side. In response to a measurement start switch (60), an interferometer moving stage (50) is moved to adjust an optical path length difference, thereby shifting the point (Q) to the point (P). The distance (d) is set to equal to or longer than necessary to move the interferometer moving stage (50) which accelerates a moving speed thereof to a predetermined speed. Thereby, image measurement can speedily start in response to request for image measurement of an object (O). It is possible to perform image measurement on the region where focus is achieved at the time of determination of the measurement region, i.e., at the position of the point (P).

REFERENCES:
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patent: 2004354317 (2004-12-01), None
N. Tanno; “Optical coherence tomography and its application to living-body imaging;”Japanese Journal of Optics; vol. 28; No. 3; 1999; pp. 116-125, cover sheet and translation (14 Sheets total.)/Discussed in the specification.
Yoshizawa, et al; “Optical Heterodyne Technology (revised edition);”New Technology Communications; 2003; pp. 1-11, cover sheet and translation (9 Sheets total.)/Discussed in the specification.
K.P. Chan et al.; “Micrometre-resolution, optical imaging of objects through highly scattering media using a heterodyne detector array;”Electronics Letters; vol. 30; No. 21; Oct. 13, 1994; pp. 1753-1754./Discussed in the specification.
M. Akiba, et al.; “Real-Time, Micrometer Depth-Resolved Imaging by Low-Coherence Reflectometry and a Two-Dimensional Heterodyne Detection Technique;”Jpn. J. Appl. Phys.; vol. 39; 2000; pp. L1194-L1196./Discussed in the specification.

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