Optical image measuring apparatus

Details Optical image measuring apparatus Optical image measuring apparatus

2007-12-25

2007-12-25

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

By light interference

Having light beams of different frequencies

C356S497000, C356S495000

Reexamination Certificate

active

11246395

ABSTRACT:
An optical image measuring apparatus capable of measuring an object to be measured which includes a birefringent layer in a short time is provided. The optical image measuring apparatus includes a broad-band light source, lenses for increasing a diameter of the light beam, a polarizing plate, a half mirror, a wavelength plate for converting the reference light to circularly polarized light, a wavelength plate for converting the signal light to circularly polarized light and converting the signal light to linearly polarized light, a frequency shifter, a polarization beam splitter for separating an S-polarized light component and a P-polarized light component from interference light, CCDs for receiving the respective polarized light components and outputting detection signals each including intensity change information, and a signal processing portion for forming an image reflecting a birefringent property, of an object to be measured based on the intensity change information.

REFERENCES:
patent: 6900899 (2005-05-01), Nevis
patent: 7038788 (2006-05-01), Matsumoto
patent: 7145661 (2006-12-01), Hitzenberger
patent: 2006/0028652 (2006-02-01), Chan et al.
patent: 2004-105708 (2004-04-01), None
N. Tanno; “The imaging technic of the optical coherence tomography and its application to living organism image;”Kogaku(Japanese Journal of Optics); vol. 28; No. 3; 1999; pp. 116-125 and Cover page (11 Sheets total)./Discussed in the specification.
T. Nakajima; “Principle and application of the optical heterodyne method;”Optical Heterodyne Technology; 2003; pp. 1-10 and Cover page (7 Sheets total)./Discussed in the specification.
K.P. Chan, et al; “Micrometre-resolution, optical imaging of objects through highly scattered media using a heterodyne detector array;”Electronics Letters; vol. 30; No. 21; Oct. 13, 1994; pp. 1753-1754./Discussed in the specification.

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