Optical extensometer and reference line mark therefor

Details Optical extensometer and reference line mark therefor Optical extensometer and reference line mark therefor

1998-12-30

2000-07-25

Rosenberger, Richard A.

Optics: measuring and testing

Material strain analysis

73800, G01N 308

Patent

active

060942592

ABSTRACT:
A reference line mark for an optical extensometer of the invention has a mark main body with a boundary shape, in which a reflectance of light is different from other portions. The boundary shape is arranged such that when the mark main body is integrated in a direction perpendicular to the deformation direction under the condition that the mark is attached to a test piece, results of the integration constitute an isosceles triangle having a base in a deformation direction of the test piece. Thus, data points for obtaining edge portions of the mark can be increased, and error-free approximation can be available. Elongation of the test piece can be measured with high accuracy at high computing speed.

REFERENCES:
patent: 4690001 (1987-09-01), Harvey et al.
patent: 4841779 (1989-06-01), Mitsuhashi et al.
patent: 4880309 (1989-11-01), Wanta
patent: 5568259 (1996-10-01), Kamegawa
patent: 5827629 (1998-11-01), Miyatake

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