4. Optics: measuring and testing
  5. Material strain analysis

Masayuki Kamegawa

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Elongation measuring method and laser noncontact extensometer

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Low-noise arrayed sensor radiation image detecting system wherei

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
Patent

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Optical extensometer and reference line mark therefor

Optics: measuring and testing – Material strain analysis
Patent

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X-ray CT apparatus

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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X-ray fluoroscopic apparatus

X-ray or gamma ray systems or devices – Electronic circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1404095

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