Optical element and method for its manufacture as well as...

Coating processes – Optical element produced

Reexamination Certificate

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C427S160000, C427S402000, C428S212000, C428S213000, C430S396000, C356S445000

Reexamination Certificate

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10491764

ABSTRACT:
In order to reduce contamination of optical elements which comprise a multilayer system on a substrate, it is proposed that the layer material and/or the layer thickness of at least one layer of the multilayer system are/is selected such that the standing wave which forms during reflection of the irradiated operating wavelength, forms a node of the electrical field intensity (node condition) in the area of the free interface of the multilayer system. Furthermore, a method for determining a design of a multilayer system, as well as a manufacturing process and a lithography apparatus are described.

REFERENCES:
patent: 3887261 (1975-06-01), Spiller
patent: 4147409 (1979-04-01), Apfel
patent: 4769290 (1988-09-01), Hettich et al.
patent: 5298351 (1994-03-01), Bobroff et al.
patent: 5307395 (1994-04-01), Seely et al.
patent: 5469489 (1995-11-01), Miyake et al.
patent: 5907436 (1999-05-01), Perry et al.
patent: 6042995 (2000-03-01), White
patent: 6231930 (2001-05-01), Klebanoff
patent: 6274280 (2001-08-01), Carcia
patent: 6280906 (2001-08-01), Braat et al.
patent: 6410928 (2002-06-01), Verhoeven et al.
patent: 6451414 (2002-09-01), Wheatley et al.
patent: 6593037 (2003-07-01), Gabriel et al.
patent: 6645679 (2003-11-01), La Fontaine et al.
patent: 6749973 (2004-06-01), Shoki et al.
patent: 6869734 (2005-03-01), Lyons et al.
patent: 6960412 (2005-11-01), Shoki
patent: 7060993 (2006-06-01), Wedowski et al.
patent: 2003/0064161 (2003-04-01), Malinowski
patent: 2004/0247485 (2004-12-01), Kraus et al
patent: 2004/0253426 (2004-12-01), Yakshin et al.
patent: 2005/0100797 (2005-05-01), Shoki et al.
patent: 2005/0104015 (2005-05-01), Wedowski et al.
patent: 2005/0123014 (2005-06-01), Shimizu et al.
patent: 2005/0199830 (2005-09-01), Bowering et al.
patent: 2006/0192158 (2006-08-01), Wedowski et al.
patent: 065532 (2001-01-01), None
patent: 1065568 (2001-01-01), None
patent: WO 99/24851 (1999-05-01), None
“Soft X-Ray Optics”, Eberhard Spiller, SPIE Optical Engineering Press, Bellingham, WA 98227, (1994) pp. 1-279.
“Investigation of Carbon Contamination of Mirror Surfaces Exposed to Synchrotron Radiation”, K. Boller et al., Nuclear Instruments and Methods 208, (1983) pp. 273-279.
“Beamline for Measurement and Characterization of Multilayer Optics for EUV Lithography”, J.H. Underwood et al., SPIE vol. 3331, (1998) pp. 52-61.
“Multilayer Reflectance During Exposure to EUV Radiation”, Sebastian Oestreich et al., Proceedings of SPIE, vol. 4146, (2000) pp. 64-71.

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