Coating processes – Optical element produced
Reexamination Certificate
2007-02-06
2007-02-06
Wells, Nikita (Department: 2881)
Coating processes
Optical element produced
C427S160000, C427S402000, C428S212000, C428S213000, C430S396000, C356S445000
Reexamination Certificate
active
10491764
ABSTRACT:
In order to reduce contamination of optical elements which comprise a multilayer system on a substrate, it is proposed that the layer material and/or the layer thickness of at least one layer of the multilayer system are/is selected such that the standing wave which forms during reflection of the irradiated operating wavelength, forms a node of the electrical field intensity (node condition) in the area of the free interface of the multilayer system. Furthermore, a method for determining a design of a multilayer system, as well as a manufacturing process and a lithography apparatus are described.
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Bijkerk Frederik
Klein Roman
Louis Eric
Stietz Frank
Wedowski Marco
Carl Zeiss SMT AG
Hudak Shunk & Farine Co.
Souw Bernard
Wells Nikita
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