Optics: measuring and testing – For size of particles
Patent
1982-03-25
1984-04-10
Sikes, William L.
Optics: measuring and testing
For size of particles
356386, G01N 1502
Patent
active
044418167
ABSTRACT:
A method for in situ measurement of particle size is described. The size information is obtained by scanning an image of the particle across a double-slit mask and observing the transmitted light. This method is useful when the particle size of primary interest is 3 .mu.m and larger. The technique is well suited to applications in which the particles are non-spherical and have unknown refractive index. It is particularly well suited to high temperature environments in which the particle incandescence provides the light source.
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Hencken Kenneth R.
Tichenor Daniel A.
Wang James C. F.
Chafin James H.
Esposito Michael F.
Koren Matthew W.
Libman George H.
Sikes William L.
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