Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1998-10-28
1999-11-23
Kim, Robert H.
Optics: measuring and testing
By particle light scattering
With photocell detection
356306, G01B 902
Patent
active
059910313
ABSTRACT:
An optical system for measuring an optical density of a sample in which homogeneity of light employed for measuring the density thereof is secured by including optical information upon a light source uniformly inside a measurement space about an optical axis therein even if the fluctuation occur in the light source in the system. A beam of light emitted from the light source and then focused on an interference filter is transformed into a parallel light through a collimator lens, and the parallel light is then split into two parallel pencils of light by an optical mask. The parallel light uniformly includes the optical information upon the light source. A reference cell is placed in a first split parallel pencil of light, and a sample cell is placed in a second split parallel pencil of light. The lights that have passed through the two cells are focused on an optical receiver by a focusing lens.
REFERENCES:
patent: 4999010 (1991-03-01), Mattson et al.
patent: 5276500 (1994-01-01), Koehler
patent: 5305077 (1994-04-01), Grego et al.
Kim Robert H.
Kurashiki Boseki Kabushiki Kaisha
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