Optical clock signal distribution using through-silicon vias

Optical waveguides – Integrated optical circuit

Reexamination Certificate

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Reexamination Certificate

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08005326

ABSTRACT:
An integrated circuit structure includes a semiconductor chip including a front surface and a back surface; a via extending from the back surface of the semiconductor chip into the semiconductor chip, wherein the via is light transparent; and a photon detector in the semiconductor chip and exposed to the via.

REFERENCES:
patent: 6898340 (2005-05-01), Tanaka
patent: 7266800 (2007-09-01), Sezginer
patent: 7432196 (2008-10-01), Tanida et al.
patent: 2003/0094699 (2003-05-01), Leas
patent: 2004/0223683 (2004-11-01), Block et al.
patent: 2005/0145783 (2005-07-01), Zheng
patent: 2006/0267206 (2006-11-01), Tanida et al.
patent: 2007/0080414 (2007-04-01), Bjorkman et al.
patent: 2008/0318360 (2008-12-01), Chen et al.
Yang, M., et al., “A High-Speed, High-Sensitivity Silicon Lateral Trench Photodetector,” IEEE Electron Device Letters, vol. 23, No. 7, Jul. 2002, pp. 395-397.

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