X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Reexamination Certificate
2007-10-30
2007-10-30
Glick, Edward J (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Telescope or microscope
Reexamination Certificate
active
11389447
ABSTRACT:
An optical axis adjusting mechanism for an X-ray lens, an X-ray analytical instrument and a method of adjusting an optical axis of an X-ray lens, capable of enhancing detection efficiency of an X-ray while preventing degradation of the device performance are provided. An optical axis adjusting mechanism for an X-ray lens to be implemented in an X-ray analytical instrument, includes an exit side adjusting mechanism for adjusting an exit side focal point of the X-ray lens to focus on an X-ray detector, and an entrance side adjusting mechanism for adjusting an entrance side focal point of the X-ray lens to focus on an analytical point of a sample, and the entrance side adjusting mechanism is disposed with a greater distance from the X-ray lens than a distance between the exit side adjusting mechanism and the X-ray lens.
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Nakayama Satoshi
Okawara Akikazu
Sasayama Norio
Adams & Wilks
Glick Edward J
Kiknadze Irakli
SII NanoTechnology Inc.
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