Optical axis adjusting mechanism for X-ray lens, X-ray...

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope

Reexamination Certificate

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Reexamination Certificate

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11389447

ABSTRACT:
An optical axis adjusting mechanism for an X-ray lens, an X-ray analytical instrument and a method of adjusting an optical axis of an X-ray lens, capable of enhancing detection efficiency of an X-ray while preventing degradation of the device performance are provided. An optical axis adjusting mechanism for an X-ray lens to be implemented in an X-ray analytical instrument, includes an exit side adjusting mechanism for adjusting an exit side focal point of the X-ray lens to focus on an X-ray detector, and an entrance side adjusting mechanism for adjusting an entrance side focal point of the X-ray lens to focus on an analytical point of a sample, and the entrance side adjusting mechanism is disposed with a greater distance from the X-ray lens than a distance between the exit side adjusting mechanism and the X-ray lens.

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patent: 7072442 (2006-07-01), Janik
patent: 2004/0005026 (2004-01-01), Fujii et al.
patent: 2003004676 (2003-01-01), None

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