Radiant energy – Photocells; circuits and apparatus – Photocell controls its own optical systems
Patent
1993-07-19
1994-12-27
Nelms, David C.
Radiant energy
Photocells; circuits and apparatus
Photocell controls its own optical systems
2502012, G01N 2186
Patent
active
053768043
DESCRIPTION:
BRIEF SUMMARY
BACKGROUND OF THE INVENTION
1. Field of the Invention
This invention relates to an optical analysis system, particularly but not exclusively suited to automated analysis of large numbers of samples, and further, to a positioning apparatus for the samples of such a system.
2. Description of the Related Art
For many clinical, forensic or other applications, it is required to perform fluorescence/polarization (FPIA) or other optical analyses on large quantities of samples, which may individually be very small "microspots".
The microspots may be typically a few tens of micrometres in diameter, and may need to be aligned with a fluorescent probe, and focussed to similar tolerances. While it is feasible to align and bring into focus a small number of samples manually, (e.g. using an adjustable stage viewed through a microscope) there is a need for a rapid method of achieving this automatically.
SUMMARY OF THE INVENTION
One object of the present invention is to provide an optical analysis system and positioning apparatus which facilitates such multiple sample analysis.
According to the present invention positioning apparatus for indexing a stage to align selectively a plurality of locations on the substrate with a focus of optical test or processing means, comprises a mounting arrangement for the substrate permitting at least two degrees of freedom of the substrate in its own plane, the substrate having on its surface an optical location, orientation and focusing pattern with at least part of which the locations have a predetermined spatial relationship, the mounting arrangement further permitting movement of the substrate in a direction transverse to its own plane, the positioning apparatus further including means so arranged in relation to the optical test or processing means as to have a common focus with the test or processing means, the imaging means having image storage means for storing at least part of an image of the location, orientation and focusing pattern and focus assessment means for assessing the position relative to the common focus of at least part of the location, orientation and focusing pattern, the apparatus further comprising control means for controlling the mounting arrangement in response to the relative disposition of live and stored images of the substrate and in response to the focus assessment means.
The imaging means preferably includes a digital data processor responsive to the disposition of a live image of the optical pattern to control the mounting arrangement to move the substrate to a position in which a selected location lies at the common focus.
The optical pattern may comprise a location and orientation reference pattern and a separate focusing pattern.
The processor may control the mounting arrangement to index the substrate through the locations successively.
The processor is preferably responsive to the imaging means to control the mounting arrangement to maximise the contrast between different parts of the image of the focusing pattern.
The optical reference pattern may identify both position and orientation on the substrate.
According to a feature of the invention, an optical analysis system may comprise positioning apparatus as aforesaid, the substrate being adapted to carry test samples at each of the locations.
BRIEF DESCRIPTION OF THE DRAWINGS
One embodiment of an optical analysis system and positioning apparatus for such a system will now be described, by way of example only, with reference to the accompanying drawings, of which:
FIG. 1 is a diagram of the overall system; and
FIGS. 2 and 3 are plan views of alternative sample carrying substrates.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
Referring to FIG. 1, a substrate 1 is carried by a mounting arrangement 3. The substrate 1 will be described subsequently but basically consists of a disc, plate or platform on which, in one application, samples for analysis are deposited. It will become clear that the nature and thickness of the substrate are not relevant to the invention and the term "substrate
REFERENCES:
patent: 3989385 (1976-11-01), Dill et al.
patent: 5148036 (1992-09-01), Matsugu et al.
GEC--Marconi Limited
Nelms David C.
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