Operating voltage determination for an integrated circuit

Details Operating voltage determination for an integrated circuit Operating voltage determination for an integrated circuit

2006-11-28

2006-11-28

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

Reexamination Certificate

active

07142996

ABSTRACT:
Voltage-binning of individual integrated circuits is achieved by operating those integrated circuits at a plurality of required clock frequencies and for each of those frequencies determining the minimum supply voltage level which produces a pass result for a series of applied test vectors.

REFERENCES:
patent: 5627412 (1997-05-01), Beard
patent: 6208542 (2001-03-01), Wang et al.
patent: 2003/0204349 (2003-10-01), Ando
patent: 2004/0025061 (2004-02-01), Lawrence
patent: 03/036448 (2003-05-01), None
patent: 03/062972 (2003-07-01), None

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