4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Electrical signal parameter measurement system

Dipesh Ishwerbhai Patel

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Diagnostic mechanism for an integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Flexibility of use of a data processing apparatus

Electrical computers and digital data processing systems: input/ – Intrasystem connection – Bus interface architecture
Reexamination Certificate

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Level shifting in a data processing apparatus

Electronic digital logic circuitry – Interface – Supply voltage level shifting
Reexamination Certificate

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Operating voltage determination for an integrated circuit

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Operating voltage determination for an integrated circuit

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2355553

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