Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2011-01-04
2011-01-04
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S207000
Reexamination Certificate
active
07864611
ABSTRACT:
A one-transistor type DRAM includes a floating body storage element connected between a bit line and a source line and controlled by a word line. The DRAM comprises a plurality of source lines and word lines arranged in a row direction, a plurality of bit lines arranged in a column direction, a plurality of reference bit lines arranged in a column direction, a cell array including the floating body storage element and formed in a region where the source line, the word line and the bit line are crossed, a reference cell array including the floating body storage element, formed in a region where the source line, the word line and the bit line are crossed and configured to output a reference current having a plurality of levels, a plurality of reference voltage generating units connected to the reference bit lines and configured to generate a plurality of reference voltages corresponding to the reference current having a plurality of levels, and a sense amplifier and a write driving unit connected to the bit line and configured to receive the plurality of reference voltages.
REFERENCES:
patent: 6888770 (2005-05-01), Ikehashi
patent: 7088629 (2006-08-01), Ohsawa
patent: 7301838 (2007-11-01), Waller et al.
An Jin Hong
Hong Suk Kyoung
Hong Sung Joo
Kang Hee Bok
Hynix / Semiconductor Inc.
IP & T Group LLP
Phung Anh
LandOfFree
One-transistor type DRAM does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with One-transistor type DRAM, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and One-transistor type DRAM will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2690757