One time programmable element system in an integrated circuit

Static information storage and retrieval – Read/write circuit – Bad bit

Reexamination Certificate

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C365S201000, C365S225700

Reexamination Certificate

active

07573762

ABSTRACT:
A system with a repairable memory array having redundant memory cells to replace one or more defective memory cells that are detected after fabrication. The system also includes non memory array circuits having circuitry that may adjust one or more operating parameters such as operating current, operating voltage, resistance, capacitance, timing characteristics and an operating mode. A set of one time programmable elements can be used to selectively store information for modifying operating parameters and replacing the defective memory cells with redundant memory cells.

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International Search Report and Written Opinion correlating to PCT/US2008/064111 dated Sep. 25, 2008.

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