Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate
2011-06-21
2011-06-21
Pham, Ly D (Department: 2827)
Static information storage and retrieval
Read/write circuit
Data refresh
C365S211000, C374S141000, C374S142000
Reexamination Certificate
active
07965571
ABSTRACT:
An on die thermal sensor (ODTS) for use in a semiconductor memory device includes: a temperature information code generation unit for sensing an internal temperature of the semiconductor memory device in response to first and second enable signals and for generating a temperature information code which includes the sensed temperature information; and a flag signal logic determination unit for generating a plurality of first flag signals having temperature information and determining whether the plurality of first flag signals have a predetermined logic level or a variable logic level in response to the first and second enable signals.
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Jeong Chun-Seok
Park Kee-Teok
Hynix / Semiconductor Inc.
IP & T Group LLP
Pham Ly D
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