On-chip timing characterizer

Details On-chip timing characterizer On-chip timing characterizer

2007-02-27

2007-02-27

Britt, Cynthia (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Skew detection correction

C714S798000

Reexamination Certificate

active

10953896

ABSTRACT:
An on-chip timing measurement circuit for improving skew measurement and timing parameter characterization in integrated logic circuits providing increased accuracy and range. The measurement circuit includes a chip delay element characterization circuit for determining chip specific delay values having one output connected to a second control input of the programmable delay generator and receiving an output from the programmable delay generator for providing a value corresponding to the measured chip specific delay element timing, the characterization circuit being enabled by a control signal from the analyzer during a setup phase of the measurement cycle thereby enhancing the accuracy of the measurement for both skew measurement and timing parameter characterization.

REFERENCES:
patent: 4504749 (1985-03-01), Yoshida
patent: 5544175 (1996-08-01), Posse
patent: 5787092 (1998-07-01), Jaynes et al.
patent: 6115836 (2000-09-01), Churchill et al.
patent: 6462998 (2002-10-01), Proebsting
patent: 6479983 (2002-11-01), Ebiya
patent: 6622103 (2003-09-01), Miller
patent: 6912665 (2005-06-01), Ellis et al.
patent: 6990613 (2006-01-01), Doi et al.
patent: 7010729 (2006-03-01), Doi et al.

Affiliated with

Also associated with

Rating

On-chip timing characterizer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with On-chip timing characterizer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and On-chip timing characterizer will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3849671