Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2003-10-09
2004-11-30
Prenty, Mark V. (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S532000, C257S536000, C438S014000, C438S017000
Reexamination Certificate
active
06825490
ABSTRACT:
BACKGROUND OF INVENTION
1. Technical Field
The present invention relates to a structure and associated method to calibrate a plurality of resistors on a semiconductor device.
2. Related Art
Electronic components in a circuit typically require correct design values in order to perform a function correctly. Incorrect design values may cause a circuit to malfunction. Therefore there exists a need to provide correct design values in a circuit.
SUMMARY OF INVENTION
The present invention provides a semiconductor device, comprising: a capacitor, a calibration resistor, and a calibration circuit formed within the semiconductor device, wherein a voltage (Vin) applied to the calibration resistor is adapted to produce a current flow through the calibration resistor to charge the capacitor, wherein the calibration circuit is adapted to measure an actual time (t
actual
) required to charge the capacitor, and wherein the calibration circuit is further adapted calculate an actual resistance value (R
actual
) of the calibration resistor based on t
actual
and a capacitance value (C) of the capacitor.
The present invention provides a calibration method, comprising:
providing a capacitor, a calibration resistor, and a calibration circuit formed within a semiconductor device;
providing a current flow through the calibration resistor to charge the capacitor;
measuring by the calibration circuit, an actual time (t
actual
) required to charge the capacitor; and
determining by the calibration circuit, an actual resistance value (R actual) of the calibration resistor based on t
actual
and a capacitance value (C) of the capacitor.
The present invention advantageously provides an apparatus and method to provide correct design values in a circuit.
REFERENCES:
patent: 6458611 (2002-10-01), Gardner
Hook Terence B.
Singh Raminderpal
Wyatt Stephen D.
Henkler Richard A.
Schmeiser Olsen & Watts
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