Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate
2008-12-29
2011-10-11
Kerveros, James C (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Replacement of memory spare location, portion, or segment
C714S723000
Reexamination Certificate
active
08037376
ABSTRACT:
An on-chip failure analysis circuit for analyzing a memory has a memory in which data is stored, a built-in self test unit which tests the memory, a failure detection unit which detects a failure of the output of the memory, a fail data storage unit in which fail data is stored, the fail data including a location of the failure, a failure analysis unit which performs failure analysis using the number of failures detected by the failure detection unit and the location of the failure, the failure analysis unit writing fail data including the analysis result in the fail data storage unit, and an analysis result output unit which outputs the analysis result of the failure analysis unit.
REFERENCES:
patent: 6304989 (2001-10-01), Kraus et al.
patent: 7200786 (2007-04-01), Cheng et al.
patent: 7228468 (2007-06-01), Wu et al.
patent: 7237154 (2007-06-01), Zorian
patent: 7260758 (2007-08-01), Agrawal et al.
patent: 7779312 (2010-08-01), Tseng et al.
patent: 2007/0011535 (2007-01-01), Anzou et al.
patent: 2008/0022176 (2008-01-01), Anzou et al.
patent: 2009/0024885 (2009-01-01), Anzou et al.
patent: 2009/0063917 (2009-03-01), Tokunaga et al.
Kawagoe, T. et al, “A Built-in Self Repair Analyzer (Cresta) for Embedded Drams” International Test Conf. 2000.
Chen, J.T. et al, “Test Response Compression and Bitmap Encoding for Embedded Memories in Manufacturing Process Monitoring” International Test Conf. 2001.
Anzou Kenichi
Tokunaga Chikako
Kabushiki Kaisha Toshiba
Kerveros James C
Turocy & Watson LLP
LandOfFree
On-chip failure analysis circuit and on-chip failure... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with On-chip failure analysis circuit and on-chip failure..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and On-chip failure analysis circuit and on-chip failure... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4281744