On-chip error detection circuit

Details On-chip error detection circuit On-chip error detection circuit

1991-07-25

1992-10-20

Harvey, Jack B.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324158R, G01R 3102

Patent

active

051573350

ABSTRACT:
A memory cell system with properties of asymmetrical operation such that the occurrence of memory error due to certain environmental disturbances is detectable. The asymmetry of operation can be adjusted to set the level at which the disturbance is detected. Detection of memory error in the system can be used to shut off access to an associated memory array in order to prevent error in the array.

REFERENCES:
patent: 4578637 (1986-03-01), Allen et al.
patent: 4670714 (1987-06-01), Sievers et al.
patent: 4685086 (1987-08-01), Tran
patent: 4789825 (1988-12-01), Carelli et al.
patent: 4794332 (1988-12-01), Schweitzer, Jr.
patent: 4859932 (1989-08-01), Whitley

Affiliated with

Also associated with

Rating

On-chip error detection circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with On-chip error detection circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and On-chip error detection circuit will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-194633