4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Jacki Garner

Representative

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Representative

active

No affiliations

Base cell for BiCMOS and CMOS gate arrays

Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – Having specific type of active device
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

On-chip error detection circuit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Jacki Garner does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Jacki Garner, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Jacki Garner will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-359579

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure