On-chip analysis and computation of transition behavior of...

Details On-chip analysis and computation of transition behavior of... On-chip analysis and computation of transition behavior of...

2007-07-24

2007-07-24

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB, C324S102000, C702S117000

Reexamination Certificate

active

11025854

ABSTRACT:
An apparatus for enabling the on-chip analysis of the voltage and/or current transition behaviour of one or more embedded nets of an integrated circuit independently of the fabrication process. The said apparatus comprises a Reference Step Generator (RSG) for providing programmable reference voltages or currents, a Step Delay Generator (SDG) for providing programmable delays, a Comparator (C) that receives the output of the reference step generator on one input, the output from the node under test at the second input, and a latch enable signal from the step delay generator, and provides a latched digital output in response to the comparison, and a controller that co-ordinates the operation of the reference step generator, Step Delay Generator and Latching Comparator to provide a transient response measurement.

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