Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2007-09-27
2010-12-14
Whitmore, Stacy A (Department: 2825)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C700S051000, C700S117000, C716S030000, C324S765010, C705S040000, C702S036000, C702S094000
Reexamination Certificate
active
07853345
ABSTRACT:
Dynamic offset determination for each of a plurality of measurement systems for matching the systems is disclosed. One embodiment uses an artifact which is periodically run across the measurement system to be matched. Inputs for each run include the current offsets and historical data for the entire fleet and the new test measurement for the current measurement system under test. Evaluation based on exponentially weighted moving average and median calculation techniques may result in a new, reset offset for one or more measurement systems. The reset offset(s) is then applied to product measurements to nullify any tool matching issues.
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Brendler Andrew C.
Chianese Danielle R.
Jankovsky Susan M.
Young Roger M.
Brown Katherine S.
Hoffman Warnick LLC
International Business Machines - Corporation
Whitmore Stacy A
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