OBIRCH dual power circuit

Details OBIRCH dual power circuit OBIRCH dual power circuit

2005-11-08

2005-11-08

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C327S535000

Reexamination Certificate

active

06963214

ABSTRACT:
Methods and apparatus for testing a semiconductor structure requiring a precise core or operating voltage with an OBIRCH analysis arrangement. The separate power supply used for providing the precise core or operating voltage is eliminated, and is replaced by connecting a circuit comprised of a plurality of Schottky diodes connected in series across the constant voltage power supply used to provide the current for the OBIRCH analysis. A precise voltage is then tapped from an anode of the series connected Schottky diodes thereby significantly reducing effects of background noise on the OBIRCH analysis.

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Nikawa, Kiyoshi, et al., “New Capabilities of OBIRCH Method for Fault Localization and Defect Detection,” 5thAsian Test Symposium (ATS '97), Nov. 17-18, 1997, pp. 214-219, 1997 Institute of Electrical and Electronics Engineers, Inc., Akita, Japan.

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