Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-07-12
2011-07-12
Ngo, Ngan (Department: 2893)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S314000, C257S315000, C257S322000, C257SE27103
Reexamination Certificate
active
07977731
ABSTRACT:
A NOR flash memory has a plurality of memory cell transistors, wherein each memory cell transistor shares the source diffusion layer with another memory cell transistor adjacent thereto on one side thereof in the column direction and shares the drain diffusion layer with another memory cell transistor adjacent thereto on the other side thereof in the column direction, and the width of the source diffusion layer in the column direction is narrower than the width of the drain diffusion layer in the column direction.
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Asada Kazuhiro
Yamawaki Hideyuki
Kabushiki Kaisha Toshiba
Liu Benjamin Tzu-Hung
Ngo Ngan
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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