Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2007-02-27
2007-02-27
Nguyen, Tuan T. (Department: 2824)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S188000
Reexamination Certificate
active
10726263
ABSTRACT:
An SRAM memory cell includes first and second inverters (14, 16) interconnected between first and second data nodes. Each inverter is formed from complementary MOS transistors (18, 20, 18′, 20′) connected in series between a DC voltage supply source and a grounding circuit (22). A circuit (28, 30) programs the MOS transistors by causing an irreversible degradation of a gate oxide layer of at least some of the transistors (18, 18′).
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International Search Report, FR 02 16558, dated Aug. 7, 2003.
Bruyere Sylvie
Candelier Philippe
Fournel Richard
Jacquet Francois
Vincent Emmanuel
Jenkens & Gilchrist PC
STMicroelectronics S.A.
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