Nonvolatile SRAM memory cell

Static information storage and retrieval – Systems using particular element – Flip-flop

Reexamination Certificate

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C365S188000

Reexamination Certificate

active

10726263

ABSTRACT:
An SRAM memory cell includes first and second inverters (14, 16) interconnected between first and second data nodes. Each inverter is formed from complementary MOS transistors (18, 20, 18′, 20′) connected in series between a DC voltage supply source and a grounding circuit (22). A circuit (28, 30) programs the MOS transistors by causing an irreversible degradation of a gate oxide layer of at least some of the transistors (18, 18′).

REFERENCES:
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patent: 5757696 (1998-05-01), Matsuo et al.
patent: 5892712 (1999-04-01), Hirose et al.
patent: 6122191 (2000-09-01), Hirose et al.
patent: 6331947 (2001-12-01), Widdershoven et al.
patent: 2003/0179630 (2003-09-01), Choi
patent: 2004/0252554 (2004-12-01), Fournel et al.
International Search Report, FR 02 16558, dated Aug. 7, 2003.

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