Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-07-17
2007-07-17
Nadav, Ori (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S316000, C257S319000
Reexamination Certificate
active
10892445
ABSTRACT:
This nonvolatile semiconductor memory includes: a first and a second memory cell column having memory cell transistors connected in series with a floating gate and a first and a second control gate located at both sides of that floating gate; a first select-gate transistor connected between the first memory cell column and a bit line; a second select-gate transistor connected between the second memory cell column and the bit line; and a third select gate transistor connected between the first memory cell column and a source line and also between the second memory cell column and the source line, respectively.
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Arai Fumitaka
Kamigaichi Takeshi
Sugimae Kikuko
Kabushiki Kaisha Toshiba
Nadav Ori
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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