Static information storage and retrieval – Read/write circuit – Including signal comparison
Reexamination Certificate
2005-09-27
2005-09-27
Nguyen, Viet Q. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Including signal comparison
C365S189011, C365S230080
Reexamination Certificate
active
06950349
ABSTRACT:
A nonvolatile semiconductor memory is provided with a main memory array and a sub-memory array. When rewriting a portion of data having been written in the main memory cell array, a modification data is written into the sub-memory cell array without erasing said main memory cell array. Further, correspondent information on a first address of the main memory cell array storing a data to be modified and a second address of the sub-memory cell array storing the modification data is recorded. At the time of a readout operation, a readout address is compared with the first address recorded in the correspondent information. When said comparison result indicates consistency, a data in the sub-memory cell array of the second address corresponding to the first address is read out. Otherwise, when the comparison result indicates inconsistency, a data in the main memory cell array corresponding to the readout address is read out.
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Fujitsu Limited
Nguyen Viet Q.
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