Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2006-07-18
2006-07-18
Nguyen, VanThu (Department: 2824)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S185170, C365S185180, C365S185290
Reexamination Certificate
active
07079437
ABSTRACT:
A nonvolatile semiconductor memory device having a plurality of electrically rewritable nonvolatile memory cells connected in series together is disclosed. A select gate transistor is connected in series to the serial combination of memory cells. A certain one of the memory cells which is located adjacent to the select gate transistor is for use as a dummy cell. This dummy cell is not used for data storage. During data erasing, the dummy cell is applied with the same bias voltage as that for the other memory cells.
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Hazama Hiroaki
Ohtani Norio
Kabushiki Kaisha Toshiba
Nguyen Van-Thu
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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