Nonvolatile semiconductor memory device and method of data...

Static information storage and retrieval – Systems using particular element – Resistive

Reexamination Certificate

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C365S189110

Reexamination Certificate

active

08085577

ABSTRACT:
A nonvolatile semiconductor memory device comprises: a plurality of first lines; a plurality of second lines; a plurality of memory cells each disposed at each of crossing-points of the first lines and the second lines and each comprising a variable resistor and a bi-directional diode; and a voltage control circuit configured to control a voltage of selected one of the first lines, unselected ones of the first lines, selected one of the second lines, and unselected ones of the second lines, respectively. The variable resistor is configured to change its resistance value depending on a polarity of a voltage applied thereto. The voltage control circuit is configured to apply a voltage pulse to the selected one of the first lines and to connect a capacitor of a certain capacitance to one end of the selected one of the second lines.

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patent: 2011/0122680 (2011-05-01), Ikeda et al.
patent: 2011/0128772 (2011-06-01), Kim et al.
patent: 2005-522045 (2005-07-01), None
U.S. Appl. No. 12/563,470, filed Sep. 21, 2009, Takayuki Tsukamoto et al.
A. Beck, et al. “Reproducible switching effect in thin oxide films for memory applications” Applied Physics Letters, vol. 77, No. 1, Jul. 3, 2000, pp. 139-141.
Yu-Sheng Chen, et al. “Forming-free HfO2Bipolar RRAM Device with Improved Endurance and High Speed Operation,” 2009. Int. Symp. VLSI Tech. System and Applications, Apr. 2009, pp. 37-38.

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