Static information storage and retrieval – Floating gate – Particular connection
Reexamination Certificate
2005-02-01
2005-02-01
Auduong, Gene N. (Department: 2818)
Static information storage and retrieval
Floating gate
Particular connection
C365S189050, C365S189070
Reexamination Certificate
active
06850437
ABSTRACT:
A nonvolatile semiconductor memory device includes a first memory cell array including electrically re-programmable main memory cells, a second memory cell array including electrically data-programmable redundancy memory cells, a first storage configured to store a specified code, a first comparator configured to compare a selected code with the specified code to generate an activating signal, a faulty address latch circuit configured to be activated by the activating signal and controlled to temporarily latch a fault address corresponding to the fault, a second storage configured to store the faulty address latched by the faulty address latch circuit, a second comparator configured to compare an input address with the faulty address to generate a replacement control signal when the input address coincides with the faulty address, and a replacing circuit configured to replace an output of the first memory cell array with an output of the second memory cell array.
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Atsumi Shigeru
Tanzawa Toru
Taura Tadayuki
Auduong Gene N.
Kabushiki Kaisha Toshiba
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