Nonvolatile semiconductor memory device

Static information storage and retrieval – Systems using particular element – Magnetoresistive

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S173000

Reexamination Certificate

active

07436699

ABSTRACT:
Source lines for a spin injection magnetic memory cell are arranged parallel to word lines for executing writing/reading of data multiple bits at a time. In a write operation, a source line potential changes in a predetermined sequence such that the source line commonly connected to a plurality of selected memory cells is set to pass a current only in one direction in each stage of the operation sequence. For the data write sequence, a current is caused to flow through memory cells according to write data sequentially, or the memory cell has a resistance state set to an initial resistance state before writing, and then changed to a state according to the write data Fast writing can be achieved in the magnetic memory without increasing a memory cell layout area.

REFERENCES:
patent: 2006/0126379 (2006-06-01), Hidaka
patent: 2007/0133265 (2007-06-01), Tsuji
patent: 2004-185754 (2004-07-01), None
patent: 2004-185755 (2004-07-01), None
patent: 2004-355670 (2004-12-01), None
patent: 2005-92912 (2005-04-01), None
patent: 2005-216387 (2005-08-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Nonvolatile semiconductor memory device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Nonvolatile semiconductor memory device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nonvolatile semiconductor memory device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3992376

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.