Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-01-02
2007-01-02
Flynn, Nathan J. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S324000, C257S411000
Reexamination Certificate
active
10330093
ABSTRACT:
A memory cell of a nonvolatile semiconductor memory device is formed on a silicon layer formed on a silicon substrate through an ONO film. The memory cell has a source region and a drain region formed in the silicon layer, an ONO film and a gate electrode. The ONO film and the ONO film include nitride films having charge trap parts trapping charges.
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Kato Hiroshi
Kuge Shigehiro
Morishita Fukashi
Noda Hideyuki
Ueno Shuichi
Buchanan & Ingersoll & Rooney PC
Flynn Nathan J.
Quinto Kevin
Renesas Technology Corp.
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