Nonvolatile semiconductor memory and method for detecting...

Static information storage and retrieval – Read/write circuit – Testing

Reexamination Certificate

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C365S185230

Reexamination Certificate

active

08085609

ABSTRACT:
There is provided a nonvolatile semiconductor memory wherein a normal mode voltage is provided to a selected word line when a normal mode is selected, and a test mode voltage lower than the normal mode voltage is provided to the selected word line when a test mode is selected, thus leakage current is detected by selecting the test mode.

REFERENCES:
patent: 5790459 (1998-08-01), Roohparvar
patent: 6016274 (2000-01-01), Itoh
patent: 6480432 (2002-11-01), Nakayama
patent: 7184305 (2007-02-01), Tanno
patent: 2000-276882 (2000-10-01), None

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