Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2009-12-29
2011-12-27
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S185230
Reexamination Certificate
active
08085609
ABSTRACT:
There is provided a nonvolatile semiconductor memory wherein a normal mode voltage is provided to a selected word line when a normal mode is selected, and a test mode voltage lower than the normal mode voltage is provided to the selected word line when a test mode is selected, thus leakage current is detected by selecting the test mode.
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patent: 5790459 (1998-08-01), Roohparvar
patent: 6016274 (2000-01-01), Itoh
patent: 6480432 (2002-11-01), Nakayama
patent: 7184305 (2007-02-01), Tanno
patent: 2000-276882 (2000-10-01), None
Oki Semiconductor Co., Ltd.
Phung Anh
Taft Stettinius & Hollister LLP
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