Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2008-05-27
2008-05-27
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S185090
Reexamination Certificate
active
07379359
ABSTRACT:
A regular sense amplifier and a defect-information sense amplifier are provided for each regular sector and each defect-information sector, respectively. This can prevent an excess load from being applied to a read path, and minimize the access time. A write amplifier is provided in common to the regular sector, the reference sector, and the defect-information sector. Generally, the write operation time of a nonvolatile semiconductor memory is long, so that an increase in a wiring load on a data transmission path and an increase in a load on a switch do not affect the write operation time much. As a result, the circuit scale can be made smaller without lengthening the read access time, and thereby the fabrication cost of the nonvolatile semiconductor memory can be reduced.
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Arent Fox LLP.
Fujitsu Limited
Phung Anh
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