Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-07-29
2008-07-29
Dang, Trung (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S316000, C257SE29129, C257SE29300
Reexamination Certificate
active
07405440
ABSTRACT:
A nonvolatile semiconductor memory on a semiconductor chip includes: a cell array region configured with a memory cell transistor having a first metallic salicide film, a first control gate electrode electrically coupled with the first metallic salicide film, and a floating gate electrode adjacent to the first control gate electrode; a high voltage circuit region including a high voltage transistor made of a second metallic salicide film, a first source region and a first drain region, and a first gate region arranged between the first source region and the first drain region; and a low voltage circuit region including a low voltage transistor made of a third metallic salicide film, a second source region and a second drain region electrically coupled with the third metallic salicide film, and a second gate region arranged between the second source region and the second drain region and is electrically coupled with the third metallic salicide film.
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Kamigaichi Takeshi
Kutsukake Hiroyuki
Sugimae Kikuko
Dang Trung
Kabushiki Kaisha Toshiba
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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